9:00 AM - 9:30 AM [14a-B13-1] [JSAP Paper Award Speech] Charge pumping current from single Si/SiO2 interface traps: Direct observation of Pb centers and fundamental trap-counting by the charge pumping method 〇Toshiaki Tsuchiya1, Ono Yukinori2 (1.Shimane Univ., 2.Shizuoka Univ.)