09:00 〜 09:30 [14a-B13-1] [優秀論文賞受賞記念講演] Charge pumping current from single Si/SiO2 interface traps: Direct observation of Pb centers and fundamental trap-counting by the charge pumping method 〇土屋 敏章1、小野 行徳2 (1.島根大、2.静岡大)
