Mari Yamshita

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Speaker, Author, Co-Author

Wed. Sep 14, 2016 1:30 PM - 3:30 PM P9 (Exhibition Hall)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[14p-P9-1~18] 15.6 Group IV Compound Semiconductors (SiC)

1:30 PM - 3:30 PM

[14p-P9-17] Ongoing Degradation Analysis for Power Semiconductor Die Attachment subjected to Thermal Cycle Test

〇Mari Yamshita¹, Tatsuhiro Suzuki¹, Sawa Araki¹, Tetsuya Mori¹, Takashi Ogihara², Hidekazu Tanaka², Hisashi Yakumaru³, Satoshi Tanimoto¹ (1.NISSAN ARC, 2.Tektronix/Keithley Japan, 3.Hitachi Power Solutions)

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