Sawa Araki

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Speaker, Author, Co-Author

Wed. Sep 14, 2016 1:30 PM - 3:30 PM P9 (Exhibition Hall)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[14p-P9-1~18] 15.6 Group IV Compound Semiconductors (SiC)

1:30 PM - 3:30 PM

[14p-P9-18] Destructive Degradation Analysis for TO-247 Package SiC-MOSFETs Subjected to Thermal Cycle Test

〇Sawa Araki¹, Tatsuhiro Suzuki¹, Mari Yamashita¹, Toshiaki Ohno², Hisashi Yakumaru³, Hiroki Sawada⁴, Satoshi Tanimoto¹ (1.NISSAN ARC, LTD., 2.Nordson Advanced Technology Japan K.K., 3.Hitachi Power Solutions Co., Ltd., 4.IWATSU TEST INSTRUMENTS Co., Ltd.)

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