Hiroshi Kaneta

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Speaker, Author, Co-Author

Thu. Sep 15, 2016 1:15 PM - 6:45 PM A23 (201B)

Oral presentation
| 15 Crystal Engineering
| 15.8 Crystal evaluation, impurities and crystal defects

[15p-A23-1~20] 15.8 Crystal evaluation, impurities and crystal defects

3:15 PM - 3:30 PM

[15p-A23-8] Bulk lifetime of free carriers evaluated by parallel dual laser-beam technique: Detection of lifetime degradation due to oxygen precipitation

〇Hiroshi Kaneta¹, Ichiro Omura¹ (1.Kyushu Inst. Tech.)

3:30 PM - 3:45 PM

[15p-A23-9] Bulk lifetime of free carriers evaluated by parallel dual laser-beam technique: Detection of lifetime degradation due to intentional Fe contamination

〇Hiroshi Kaneta¹, Ichiro Omura¹ (1.Kyushu Inst. Tech.)