Shinichi Ogawa

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Speaker, Author, Co-Author

Tue. Sep 13, 2016 9:00 AM - 11:45 AM A31 (302A)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[13a-A31-1~11] 6.3 Oxide electronics

9:30 AM - 9:45 AM

[13a-A31-3] Characterization of VO2 film domains by helium ion microscope (HIM) at controlled temperatures and voltage

〇Shinichi Ogawa¹, Tomohiko Iijima¹, Teruo Kanki², Hidekazu Tanaka² (1.AIST, 2.Osaka Univ.)

Thu. Sep 15, 2016 1:45 PM - 6:30 PM B10 (Exhibition Hall)

Oral presentation
| 13 Semiconductors
| 13.4 Si wafer processing /Si based thin film /MEMS/Integration technology

[15p-B10-1~17] 13.4 Si wafer processing /Si based thin film /MEMS/Integration technology

4:30 PM - 4:45 PM

[15p-B10-10] Structural changes of an organic film during observation by helium ion and secondary electron microscopes imaging

〇Shinichi Ogawa¹, Tomohiko Iijima¹ (1.AIST)

Wed. Sep 14, 2016 4:00 PM - 6:00 PM P18 (Exhibition Hall)

Poster presentation
| 12 Organic Molecules and Bioelectronics
| 12.6 Nanobiotechnology

[14p-P18-1~19] 12.6 Nanobiotechnology

4:00 PM - 6:00 PM

[14p-P18-12] Observation and etching of human chromosome by helium/neon ion microscopy

〇Shinichi Ogawa^1,3, Soma Sasakura¹, Kohei Kaneyoshi¹, Hideaki Takata¹, Susumu Uchiyama¹, Kiichi Fukui^1,2 (1.Osaka Univ., 2.Tottori Univ., 3.AIST)