Yuji Yamagishi

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Speaker, Author, Co-Author

Fri. Sep 16, 2016 9:00 AM - 12:15 PM C302 (Nikko Houou)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[16a-C302-1~12] 15.6 Group IV Compound Semiconductors (SiC)

10:15 AM - 10:30 AM

[16a-C302-6] Evaluation of Local Capacitance Characteristics of SiO₂/4H-SiC Interface by Scanning Nonlinear Dielectric Microscopy

〇Yuji Yamagishi¹, Norimichi Chinone¹, Yasuo Cho¹ (1.Res. Inst. of Electrical Commun., Tohoku Univ.)