Tokuo Yodo

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Speaker, Author, Co-Author

Fri. Sep 16, 2016 9:30 AM - 11:30 AM P5 (Exhibition Hall)

Poster presentation
| 15 Crystal Engineering
| 15.4 III-V-group nitride crystals

[16a-P5-1~32] 15.4 III-V-group nitride crystals

9:30 AM - 11:30 AM

[16a-P5-23] Examination for control of mixed crystal ratio on growth process of In_1-XGa_XN and In_1-XAl_XN films by plasma damage-reduced ECR-MBE method

〇Tokuo Yodo¹, Ryuma Nakagawa¹, Shinya Matsushita¹, Akira Fujimoto², Yoshiyuki Harada², Mamoru Yoshimoto³ (1.Osaka Inst. of Tech., 2.Osaka Inst. of Tech. Gene., 3.Tokyo Inst.Tech.)