Hiroyuki Kajifusa

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Speaker, Author, Co-Author

Fri. Sep 16, 2016 1:45 PM - 4:15 PM C302 (Nikko Houou)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[16p-C302-1~9] 15.6 Group IV Compound Semiconductors (SiC)

2:00 PM - 2:15 PM

△ [16p-C302-2] Effect by the Control of the Wet Oxidation Conditions on 4H-SiC C-face MOS Interface Properties

〇(M2)Hiroyuki Kajifusa¹, Koji Kita¹ (1.The Univ. of Tokyo)