[13a-A25-1~11] 7.4 Buried interface sciences with quantum beam

[13a-A25-2] 2D force spectroscopy under X-ray irradiation on Ni nanoparticles by XANAM

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:synchrotrron radiation X-ray, noncontact atomic froce microscopy, elemental analysis

For elemental analysis on nano-structures on surfaces/interfaces, we have engaged development of X-ray aided noncontact atomic force microscopy (XANAM). Based on our previous results on force spectroscopy at a point on a surface, 2D force spectroscopy on Ni nanoparticles deposited on HOPG sample surface was carried out under X-ray irradiation in order to clarify a limit of spatial resolution as XANAM.