[13a-A25-1~11] 7.4 Buried interface sciences with quantum beam

[13a-A25-9] Analysis of stomic-scale and electronic structures of epitaxial Mg_xNi_1-xO thin films using synchrotron x-ray diffraction and hard x-ray photoelectron spectroscopy

〇Osami Sakata^1,2, Yanna Chen¹, Ryosuke Yamauchi², Anli Yang¹, Kumara L.S.R¹, Chulho Song¹, Natalia Palina¹, Akifumi Matsuda², Mamoru Yoshimoto² (1.NIMS, 2.Tokyo Tech)

Keywords:Synchrotorn x-ray diffration, x-ray reciprocal lattice space mapping, hard x-ray photoelectron spectroscopy

The effects of Mg dopant on lattice structure and electronic structures of Mg_xNi_1-xO (0 ≤ x ≤0.52) (111) thin films were investigated. The ca. 40 nm thick films were grown epitaxially on ultra-smooth sapphire (0001) substrates by pulse laser deposition. The high-resolution x-ray reciprocal–lattice space mapping (XRSM) and hard x-ray photoelectron spectroscopy (HAXPES) were utilized. Experiments were performed at the NIMS beamline BL15XU, SPring-8.
Upon doping with Mg, the atomic-scale structure is discussed in terms of changes in: (i) lattice distortion, (ii) crystalline mosaic spread, and (iii) static atomic disorder using Debye parameter; in addition, electronic structure is also discussed on the basis of a Configuration-interaction model including a Zhang-Rice doublet bound state.