[13p-A32-1~8] Active Woman Researchers in the Field of Surface and Thin Film

[13p-A32-6] Damage-free, Area-controlled Electric Contact to 2D Thin Films

〇Michiko Yoshitake¹ (1.NIMS)

Keywords:probe, electric measurements, ultra-thin films

A probe for damage-free electric contact is developed. This probe enables to measure electric properties of samples such as ultra-thin films and 2D films without destroying the sample using commercially available probers.