[13p-C31-1~11] 7.1 X線技術

▲ [13p-C31-1] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing – III

〇(P)Shivaji Bachche¹、Masahiro Nonoguchi²、Koichi Kato²、Masashi Kageyama²、Takafumi Koike²、Masaru Kuribayashi²、Atsushi Momose¹ (1.Tohoku University、2.Rigaku)

キーワード：x-ray phase imaging, phase scanner, non-destructive testing

Using X-ray phase imaging approach, X-ray Talbot interferometry and X-ray Talbot-Lau interferometry technique was proposed to realize the practical applications in clinical and industrial fields. Recently, for non-destructive industrial testing, an X-ray Talbot-Lau interferometer scanning setup consisting of three transmission gratings, a laboratory-based X-ray source that emits X-rays vertically, and an image detector on the top has been developed for the application of X-ray phase imaging to moving objects that cannot generate sufficient absorption contrast. A new algorithm to achieve the function of phase stepping without grating displacement and by analyzing movie of moiré pattern has been reported in which the effect of built-in moiré pattern is measured in advance without samples. Next, a sample moving at 5 mm/s speed across the moiré pattern is recorded in a movie and three images showing absorption, refraction, and scattering of X-rays by the sample are generated. The performance of phase scanner with Talbot-Lau interferometer configuration was tested using laboratory X-ray source and by scanning a long moving sample at a speed of 5 mm/s and absorption, differential-phase and visibility images were generated by processing non-uniform moiré movie.
This research work demonstrated the feasibility of scanning continuously moving long samples on belt-conveyors using an X-ray phase-sensitive scanning setup for non-destructive industrial testing. This achievement has brought a breakthrough for practical industrial applications of X-ray phase imaging for screening objects carried on a belt-conveyers for instance at factories. The imaging performance and evaluation of the X-ray phase scanner in terms of sample scanning speed, SNR, and spatial resolution will be reported.
This research work is supported by JST-SENTAN project.