The 77th JSAP Autumn Meeting, 2016

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[14p-A32-1~16] 6.6 Probe Microscopy

Wed. Sep 14, 2016 1:15 PM - 5:30 PM A32 (302B)

Akira Sasahara(Kobe Univ.), Shu Kurokawa(Kyoto Univ.)

4:30 PM - 4:45 PM

[14p-A32-13] Optical- and AFM imaging of nano-particles

〇Hiroshi Itoh1, Yasuyuki Aoyama1, Motoharu Shichiri1 (1.AIST)

Keywords:Scanning probe microscopy, Nano-particle, Optical microscope

Atomic force microscope combined with optical microscope is developped. Near field lighting to the nanomaterial and other lighting method is developped to identify the materials, which is smaller than half of the wavelength.