[14p-A32-1~16] 6.6 Probe Microscopy

[14p-A32-15] Atomic Force Microscopy Measurement on In/Si(111)-8×2 surface

〇(DC)Kota Iwata¹, Shiro Yamazaki², Akitoshi Shiotari³, Yoshiaki Sugimoto^1,3 (1.Osaka Univ., 2.Tokyo Tech., 3.Univ. of Tokyo)

Keywords:atomic force microscopy, 1 dimensional metal, phase transition

In/Si(111) surface exhibits characteristic metal-insulator transition @ 120K. Its geometric and electronic structure have been extensively examined. In this work, we used atomic force microscopy, which is sensitive to geometry, to measure its structure before and after the phase transition in high resolution. As a result, we obtained AFM images of both phases and observed characteristic modulation of periodicity.