The 77th JSAP Autumn Meeting, 2016

Presentation information

Symposium (Oral)

Symposium » Crystallization of IV element Semiconductor thin-film and Deffects control

[14p-B7-1~17] Crystallization of IV element Semiconductor thin-film and Deffects control

Wed. Sep 14, 2016 12:30 PM - 7:15 PM B7 (Exhibition Hall)

Naoto Matsuo(Univ. of Hyogo), Seiichiro Higashi(Hiroshima Univ.), Noritaka Usami(Nagoya Univ.), Ichiro Yonenaga(Tohoku Univ.)

4:15 PM - 4:45 PM

[14p-B7-10] Effects of defects in crystalline Ge substrates on FET performance

Akira Toriumi1, Tomonori Nishimura1 (1.Univ. Tokyo)

Keywords:germanium, defects

We have worked for high performance Ge FETs, and we found that Ge substrate had big effects on FET performance. Although it may sound quite natural, it is not true. Electron mobility was significantly different just by changing the substrate in spite of the fact that gate stack characteristics were exactly the same by employing the same fabrication process. We have investigated the origin for this difference. So, in this talk, we would like to discus about such strange characteristics of Ge in terms of defects in Ge substrate.