The 77th JSAP Autumn Meeting, 2016

Presentation information

Poster presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[14p-P15-1~2] 7.2 Applications and technologies of electron beams

Wed. Sep 14, 2016 4:00 PM - 6:00 PM P15 (Exhibition Hall)

4:00 PM - 6:00 PM

[14p-P15-1] Dependence of the working distance and the applied bias on the surface potential distribution of insulating specimen irradiated by electron beam

〇(M2)Masasi Tokai1, Takuya Kawamoto1, Masatoshi Kotera1 (1.Osaka Institute of Technology)

Keywords:SEM, Charging, Surface potential