The 77th JSAP Autumn Meeting, 2016

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Oral presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[15a-A23-1~10] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Sep 15, 2016 9:00 AM - 11:45 AM A23 (201B)

Kentaro Kutsukake(Tohoku Univ.), Hiroki Kawai(Toshiba)

9:45 AM - 10:00 AM

[15a-A23-4] CZ Si Crystals contacted with Melt during Pull-Stop(Ⅱ) -Species under 1000℃ region-

〇Takao Abe1, Takahashi Toru1, Shirai Koun2 (1.ShinEtsu Handotai, 2.ISIR, Osaka Univ.)

Keywords:CZ Si, Point Defects