The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[15a-B1-1~13] 13.8 Compound and power electron devices and process technology

Thu. Sep 15, 2016 9:00 AM - 12:30 PM B1 (Exhibition Hall)

Kenji Shiojima(Univ. of Fukui)

9:30 AM - 9:45 AM

[15a-B1-3] Ga2O3 Field-Plated Schottky Barrier Diodes with a Breakdown Voltage of Over 1 kV

Keita Konishi1, Ken Goto2,3, Rie Togashi3, Hisashi Murakami3, Yoshinao Kumagai3, Bo Monemar3,4, Akito Kuramata2, Shigenobu Yamakoshi2, Masataka Higashiwaki1 (1.NICT, 2.Tamura Corp., 3.TAT, 4.Linkoping Univ.)

Keywords:Gallium oxide, Schottky Barrier Diodes, Field Plate

Gallium oxide (Ga2O3) is an attractive oxide semiconductor for next-generation power devices due to its extremely large bandgap of over 4.5 eV. The success of halide vapor phase epitaxy (HVPE) for high-speed growth of high-quality Ga2O3 thin films has led to full-scale development of vertical Ga2O3 devices. In this work, we report the first demonstration of Ga2O3 field-plated Schottky barrier diodes (FP-SBDs) with a record breakdown voltage (Vbr) of over 1 kV.