The 77th JSAP Autumn Meeting, 2016

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[15a-C32-1~12] 3.8 Optical measurement, instrumentation, and sensor

Thu. Sep 15, 2016 9:00 AM - 12:15 PM C32 (Nikko Kujaku CD)

Takanori Nomura(Wakayama Univ.), Hajime Inaba(AIST)

11:00 AM - 11:15 AM

[15a-C32-8] Calibration method of four detector polarimeter using dual rotating polarization components

Kento Kowa1, Takehisa Shibuya1, Moriaki Wakaki1, Hiroyuki Kowa2 (1.Tokai Univ., 2.Uniopt)

Keywords:polarization, four detector polarimeter, caribration

We will present a novel calibration technique by using of dual rotation polarization components for four detector polarimeter(FDP). An optical setup for calibrating FDP consists of a linear polarizer and a quarter-wave plate in rotating ratio of one to two. The fourier analysis is used to calculate a instrument matrix which associates the polarization state and optical intensity detected by detectors of FDP. Experimental results correspond reasonably well the theoretical values.