The 77th JSAP Autumn Meeting, 2016

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Joint Session K "Wide bandgap oxide semiconductor materials and devices" » Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[15p-A22-1~17] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

Thu. Sep 15, 2016 1:30 PM - 6:00 PM A22 (Main Hall B)

Yasuaki Ishikawa(NAIST), Mamoru Furuta(Kochi Univ. of Tech.)

3:45 PM - 4:00 PM

[15p-A22-9] Characterization of reliability on NBITS Instabilities of Amorphous Oxide Semiconductors using reflection CPM and their relations with TFT instabilities

〇Yuuki Ohno1, Satoshi Tanaka1, Kousaku Shimizu1 (1.Nihon Univ.)

Keywords:Oxide Semiconductor