The 77th JSAP Autumn Meeting, 2016

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15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[15p-A23-1~20] 15.8 Crystal evaluation, impurities and crystal defects

Thu. Sep 15, 2016 1:15 PM - 6:45 PM A23 (201B)

Takahiro Maeta(Global Wafers Japan), Takuto Kojima(Meiji Univ.), Yutaka Ohno(Tohoku Univ.)

5:15 PM - 5:30 PM

△ [15p-A23-15] Determination of Low Carbon Concentration in CZ-Si for Solar Cells by Luminescence Activation Using Electron Irradiation

〇Hirotatsu Kiuchi1, Michio Tajima1, Fumito Higuchi1, Atsushi Ogura1, Nobuhito Iida2, Shoji Tachibana2, Isao Shoda2, Eiichi Nishijima2 (1.Meiji Univ., 2.Tokuyama Corporation)

Keywords:photoluminescence, carbon concentration