The 77th JSAP Autumn Meeting, 2016

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Poster presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[15p-P3-1~32] 6.3 Oxide electronics

Thu. Sep 15, 2016 1:30 PM - 3:30 PM P3 (Exhibition Hall)

1:30 PM - 3:30 PM

[15p-P3-17] Correlation between Parameters of Absorbed Solution into Memory Layer and Resistive Switching Properties

〇(M2)Koki Kawano1, Katsuyuki Ochiai1, Satoru Kishida1,2, Kentaro Kinoshita1,2 (1.Tottori Univ., 2.TiFREC)

Keywords:ReRAM, Oxide electronics, NiO