[15p-P3-1~32] 6.3 Oxide electronics

[15p-P3-16] Diffuse ion species and memory layer material dependences on the reliability of resistive random access memories

〇Shinya Tanaka¹, Kentaro Kinoshita^1,2, Satoru Kishida^1,2 (1.Tottori Univ., 2.Tottori Integrated Frontier Research Center)

Keywords:CBRAM and ReRAM, Retention