The 77th JSAP Autumn Meeting, 2016

Presentation information

Poster presentation

8 Plasma Electronics » 8.3 deposition of thin film and surface treatment

[15p-P6-1~16] 8.3 deposition of thin film and surface treatment

Thu. Sep 15, 2016 1:30 PM - 3:30 PM P6 (Exhibition Hall)

1:30 PM - 3:30 PM

[15p-P6-13] Surface Treatment of Semiconductor Thermionic Emitter Using Ar/O2 Mixed Surface-wave Plasma

takatoshi watanabe1, Yoshiki Nakano1, Akihisa Ogino1, Naoya Morioka2, Yuji Kimura2 (1.Shizuoka Univ., 2.DENSO CORP.)

Keywords:thermionic emission, semiconductor, microwave plasma

To decrease the operation temperature of thermionic energy converter (TEC) which has been a subject of conventional TEC with metal electrodes, the improvement of Cs stability on a hot emitter and the characteristics of thermionic emission from semiconductor surfaces, such as diamond thin film and Si treated using surface wave plasma, were discussed. The emission characteristics of plasma treated surfaces was improved since the Cs adsorption was stabilized by plasma introduced oxygen atoms.