10:30 〜 10:45
▲ [19a-S224-6] Effect of Gate Dielectrics on Trap Density in PbS Nanocrystal Field-Effect Transistors
〇(D)Nugraha Mohamad Insan1,2、Matsui Hiroyuki1、Hausermann Roger1、Bisri Satria Zulkarnaen3、Sytnyk Mykhailo4、Heiss Wolfgang4、Loi Maria Antonietta2、Takeya Jun1 (1.Univ. Tokyo、2.Univ. Groningen、3.RIKEN、4.Univ. Linz)