Bin Liu

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Speaker, Author, Co-Author

Sat. Mar 19, 2016 3:30 PM - 6:00 PM S223 (S2)

Oral presentation
| 13 Semiconductors
| 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19p-S223-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

4:30 PM - 4:45 PM

△ [19p-S223-5] The research of quantification of carrier density by dC/dV and dC/dz measurement with Scanning Nonlinear Dielectric Microscopy

〇Bin Liu¹, Yoshiomi Hiranaga¹, Norimichi Chinone¹, Yasuo Cho¹ (1.Tohoku Univ.)