Bin Han

Speaker, Author, Co-Author

Sat. Mar 19, 2016 1:30 PM - 6:00 PM W834 (W8)

Oral presentation
| 9 Applied Materials Science
| 9.2 Nanowires and Nanoparticles

[19p-W834-1~17] 9.2 Nanowires and Nanoparticles

4:30 PM - 4:45 PM

▼ [19p-W834-12] Characterization of Dopant in Individual Si / Ge Core-Shell Nanowires Investigated by Atom Probe Tomography

〇(DC)Bin Han¹, Yasuo Shimizu¹, Wipakorn Jevasuwan², Kotaro Nishibe^2,3, Koji Inoue¹, Naoki Fukata², Yasuyoshi Nagai² (1.IMR, Tohoku Univ., 2.NIMS, 3.Tsukuba Univ.)

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