Kazuma Noguchi

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Speaker, Author, Co-Author

Sun. Mar 20, 2016 9:15 AM - 11:45 AM H111 (H)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[20a-H111-1~10] 6.3 Oxide electronics

10:00 AM - 10:15 AM

[20a-H111-4] Evaluation of Stored Charge in HfO₂/SiO₂/Si structure

〇(M1)Kazuma Noguchi¹, Hiromori Yutaro¹, Miyatake Shinji¹, Nara Yasuo¹ (1.Univ. of Hyogo)