Tomoko Mizutani

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Speaker, Author, Co-Author

Sun. Mar 20, 2016 9:00 AM - 12:15 PM S422 (S4)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[20a-S422-1~12] 13.5 Semiconductor devices and related technologies

9:30 AM - 9:45 AM

[20a-S422-3] Transistor-level Characterization of SRAM Bit Failures Induced by Random Telegraph Noise

〇Tomoko Mizutani¹, Takuya Saraya¹, Kiyoshi Takeuchi¹, Masaharu Kobayashi¹, Toshiro Hiramoto¹ (1.IIS, Univ. of Tokyo)