Kazuki Shida

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Speaker, Author, Co-Author

Sun. Mar 20, 2016 1:15 PM - 4:30 PM H112 (H)

Oral presentation
| 15 Crystal Engineering
| 15.5 Group IV crystals and alloys

[20p-H112-1~12] 15.5 Group IV crystals and alloys

3:00 PM - 3:15 PM

[20p-H112-7] Tomographic mapping analysis of high Ge content SiGe films with compositionally graded layers by X-ray microdiffraction

〇Kazuki Shida¹, Shotaro Takeuchi¹, Yasuhiko Imai², Shigeru Kimura², Akira Sakai¹ (1.Osaka Univ., 2.JASRI/SPring-8)