Wataru Mizubayashi

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Speaker, Author, Co-Author

Sun. Mar 20, 2016 1:45 PM - 6:30 PM S422 (S4)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[20p-S422-1~18] 13.5 Semiconductor devices and related technologies

5:30 PM - 5:45 PM

[20p-S422-15] Analysis of NBTI Degradation in p-type Tunnel FETs

〇Wataru Mizubayashi¹, Takahiro Mori¹, Koichi Fukuda¹, Yuki Ishikawa¹, Yukinori Morita¹, Shinji Migita¹, Hiroyuki Ota¹, Yongxun Liu¹, Shinichi Ouchi¹, Junichi Tsukada¹, Hiromi Yamauchi¹, Takashi Matsukawa¹, Meishoku Masahara¹, Kazuhiko Endo¹ (1.AIST)

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