Ryota Takabe

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Speaker, Author, Co-Author

Mon. Mar 21, 2016 9:00 AM - 12:30 PM S223 (S2)

Oral presentation
| 13 Semiconductors
| 13.2 Exploratory Materials, Physical Properties, Devices

[21a-S223-1~13] 13.2 Exploratory Materials, Physical Properties, Devices

9:30 AM - 9:45 AM

[21a-S223-3] Measurement of band alignment at a-Si/BaSi₂ interfaces using hard x-ray photoelectron
spectroscopy

〇Ryota Takabe¹, Hiroki Takeuchi¹, Weijie Du¹, Keita Ito^1,2,3, Kaoru Toko¹, Shigenori Ueda⁴, Akio Kimura⁵, Takashi Suemasu¹ (1.Univ. Tsukuba, 2.JSPS, 3.Tohoku Univ., 4.NIMS, 5.Hiroshima Univ.)