Kouhei Kimura

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Speaker, Author, Co-Author

Mon. Mar 21, 2016 1:00 PM - 6:45 PM H111 (H)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[21p-H111-1~22] 6.3 Oxide electronics

6:00 PM - 6:15 PM

[21p-H111-20] Reliability evaluation of anion diffusion type ReRAM based on charge state

〇Kouhei Kimura¹, Koutoku Ohmi^1,2, Satoru Kishida^1,2,3, Kentaro Kinoshita^1,2,3 (1.Tottori Univ., 2.TEDREC, 3.TiFREC)