Rikiichi Ohno

→ Search for Rikiichi Ohno in Google Scholar

Speaker, Author, Co-Author

Mon. Mar 21, 2016 1:15 PM - 4:45 PM H112 (H)

Oral presentation
| 15 Crystal Engineering
| 15.3 III-V-group epitaxial crystals

[21p-H112-1~13] 15.3 III-V-group epitaxial crystals

1:15 PM - 1:30 PM

[21p-H112-1] Quantitative analysis of trace metallic contamination of III-V compound semiconductor surfaces

〇Rikiichi Ohno¹, Koichiro Saga¹ (1.SONY)