Sawa Araki

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Speaker, Author, Co-Author

Mon. Mar 21, 2016 1:30 PM - 3:30 PM P10 (Gymnasium)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[21p-P10-1~24] 15.6 Group IV Compound Semiconductors (SiC)

1:30 PM - 3:30 PM

[21p-P10-23] Degradation Analysis for TO-247 Pack SiC-MOSFETs stored at a High Temperature

〇Sawa Araki¹, Tatsuhiro Suzuki¹, Mari Yamashita¹, Toshiaki Ohno², Hisashi Yakumaru³, Hiroki Sawada⁴, Satoshi Tanimoto¹ (1.NISSAN ARC, LTD., 2.Nordson Advanced Technology Japan K.K., 3.Hitachi Power Solutions Co.,Ltd., 4.IWATSU TEST INSTRUMENTS CORPORATION)

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