Tsuyoshi Nishi

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Speaker, Author, Co-Author

Mon. Mar 21, 2016 4:00 PM - 6:00 PM P15 (Gymnasium)

Poster presentation
| 3 Optics and Photonics
| 3.8 Optical measurement, instrumentation, and sensor

[21p-P15-1~23] 3.8 Optical measurement, instrumentation, and sensor

4:00 PM - 6:00 PM

[21p-P15-12] Novel non-destructive thickness measurement method by a white light OCT with FDTD simulation for optical device fabrication

〇Tsuyoshi Nishi¹, Nobuhiko Ozaki¹, Yoichi Oikawa², Kunio Miyaji², Hirotaka Ohsato³, Eiichiro Watanabe³, Naoki Ikeda³, Yoshimasa Sugimoto³ (1.Wakayama Univ., 2.Think-Lands Co. Ltd., 3.NIMS)

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