9:00 AM - 9:15 AM [22a-W541-1] Estimation of ALD-HfO2/AlGaN interface with post-deposition annealing by X-ray photoelectron spectroscopy using synchrotron radiation 〇Toshiharu Kubo1, Gosuke Nishino1, Takashi Egawa1 (1.Nagoya Inst. Tech.)