Symposium
Symposium » State-of-the-art characterization technique of dielectric and ferroelectric materials
Sun. Mar 20, 2016 1:45 PM - 6:15 PM W641 (W6)
Wataru Sakamoto(Nagoya Univ.), Satoshi Wada(Univ. of Yamanashi)
1:45 PM - 2:15 PM
〇Yukinobu Hikosaka1 (1.FUJITSU SEMICONDUCTOR LIMITED)
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2:15 PM - 2:45 PM
〇Naoya Shibata1 (1.Univ. Tokyo)
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2:45 PM - 3:15 PM
〇Hiroki Taniguchi1 (1.Nagoya Univ.)
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3:15 PM - 3:45 PM
〇Hitoshi Morioka1 (1.Bruker AXS)
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4:00 PM - 4:15 PM
〇Atsushi Inuzuka1, Shusuke Takahashi1, Kota Yoshida1, Ryotaro Inoue2, Yuji Noguchi1, Masaru Miyayama1 (1.Univ. of Tokyo, 2.Nihon Univ.)
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4:15 PM - 4:45 PM
〇Iwazaki Yoshiki1 (1.TAIYO YUDEN)
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4:45 PM - 5:15 PM
〇Ishii Koji1 (1.Oxford Instruments)
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5:15 PM - 5:45 PM
〇Akira Ando1 (1.Murata Mfg. Co.)
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5:45 PM - 6:15 PM
〇Isaku Kanno1, Yuichi Tsujiura1, Fumiya Kurokawa1, Hirotaka Hida1 (1.Kobe Univ.)
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