Akira Ando

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Speaker, Author, Co-Author

Sun. Mar 20, 2016 1:45 PM - 6:15 PM W641 (W6)

Symposium
| Symposium
| State-of-the-art characterization technique of dielectric and ferroelectric materials

[20p-W641-1~9] State-of-the-art characterization technique of dielectric and ferroelectric materials

5:15 PM - 5:45 PM

[20p-W641-8] Reliability evaluation of dielectric materials

〇Akira Ando¹ (1.Murata Mfg. Co.)