[19a-S223-1~13] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19a-S223-1] Strong-Coupling Analysis Method for Multiple Devices and Circuit

〇Masanori Harada¹, Takuhito Kuwabara¹, Yasuyuki Ookura¹, Ken Yamaguchi¹, Hideaki Koike¹ (1.AdvanceSoft)

Keywords:semiconductor,device simulation,circuit analysis