The 63rd JSAP Spring Meeting, 2016

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Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[19a-S223-1~13] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sat. Mar 19, 2016 9:00 AM - 12:30 PM S223 (S2)

Nobuya Mori(Osaka Univ.)

10:15 AM - 10:30 AM

[19a-S223-6] Device scaling effects on soft errors caused by long traveled delta-rays

〇Shimpei Fuchida1,2, Daisuke Kobayashi1,2, Kazuyuki Hirose1,2 (1.Tokyo Univ., 2.ISAS/JAXA)

Keywords:soft error