The 63rd JSAP Spring Meeting, 2016

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Symposium » Blazing frontier of luminescence imaging for characterization of semiconductor crystals and devices

[19p-S011-1~11] Blazing frontier of luminescence imaging for characterization of semiconductor crystals and devices

Sat. Mar 19, 2016 1:30 PM - 5:45 PM S011 (S0)

Yasuaki Ishikawa(NAIST), Ryuji Katayama(Tohoku Univ.), Hiroshi Yano(Univ. of Tsukuba)

5:15 PM - 5:45 PM

[19p-S011-11] Nanospectroscopic investigation of individual free-standing semiconductor nanocrystals using nanoprobe-cathodoluminscence techniques

〇Kentaro Watanabe1,2 (1.Osaka Univ., 2.NIMS)

Keywords:semiconductor,Free-standing nanocrystals,Cathodoluminescence