The 63rd JSAP Spring Meeting, 2016

Presentation information

Print

Symposium

Symposium » Blazing frontier of luminescence imaging for characterization of semiconductor crystals and devices

[19p-S011-1~11] Blazing frontier of luminescence imaging for characterization of semiconductor crystals and devices

Sat. Mar 19, 2016 1:30 PM - 5:45 PM S011 (S0)

Yasuaki Ishikawa(NAIST), Ryuji Katayama(Tohoku Univ.), Hiroshi Yano(Univ. of Tsukuba)

2:30 PM - 3:00 PM

[19p-S011-4] Characterization of CIGS solar cells by photoluminescence mapping method

〇Sho Shirakata1 (1.Ehime Univ.)

Keywords:photoluminescence,CIGS solar cell,mapping measurement

PL mapping studies have been carried out on the CIGS thin film solar cells with emphasis on the high sensitivity of PL intensity on the photovoltage due to the PL excitation light. The distribution of the photovoltage has been examined for the (i) Laser Assisted Deposition, (ii) the light soaking effect, (iii) mapping of the defect related PL, (iv) solar cell process, and (v) effect of Na barrier on the photovoltage uniformity.