The 63rd JSAP Spring Meeting, 2016

Presentation information

Symposium

Symposium » New developments in polarization measurement and control

[19p-S621-1~9] New developments in polarization measurement and control

Sat. Mar 19, 2016 1:30 PM - 5:15 PM S621 (S6)

Yukitoshi Otani(Utsunomiya Univ.), Kazuhiko Oka(Hokkaido Univ.)

5:00 PM - 5:15 PM

[19p-S621-9] A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs

〇(B)Nia Natasha Tipol1, Shuichi Kawabata2, Yukitoshi Otani1 (1.Utsunomiya Univ. for Utsunomiya University, 2.Tokyo Polytechnic Univ. for Tokyo Polytechnic University)

Keywords:mueller matrix,photoelastic modulator

The theoretical approach is presented for measuring the partial Mueller matrix of a sample by using two photoelastic modulator-polarizer pairs, where the photoelastic modulators are operating at different resonant frequencies. The two PEMs in the instrument are oriented 45° apart. From the given configuration, partial Mueller matrix in terms of the output light intensity of the light beam can be defined.