The 63rd JSAP Spring Meeting, 2016

Presentation information

Oral presentation

15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-H113-1~12] 15.8 Crystal evaluation, impurities and crystal defects

Sun. Mar 20, 2016 9:30 AM - 12:45 PM H113 (H)

Kentaro Kutsukake(Tohoku Univ.), Yuta Nagai(GlobalWafers Japan)

12:00 PM - 12:15 PM

[20a-H113-10] Photoluminescence analysis of impurity effects in highly doped Si

KEI NAKAGAWA1, Michio Tajima1, Atsushi Ogura1 (1.Meiji Univ.)

Keywords:Si crystal,Photoluminescence,Impurity effect