The 63rd JSAP Spring Meeting, 2016

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15 Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-H113-1~12] 15.8 Crystal evaluation, impurities and crystal defects

Sun. Mar 20, 2016 9:30 AM - 12:45 PM H113 (H)

Kentaro Kutsukake(Tohoku Univ.), Yuta Nagai(GlobalWafers Japan)

12:30 PM - 12:45 PM

[20a-H113-12] Bulk lifetime of free carriers evaluated by parallel dual laser-beam technique: Optical setup for parallel dual laser-beams

〇Hiroshi Kaneta1, Ichiro Omura1 (1.Kyushu Inst. Tech.)

Keywords:silicon,carrier lifetime,power device