[20p-H137-1~15] 7.5 Ion beams

[20p-H137-5] Measurements of Secondary Ions Produced by Vacuum-type Charged Droplet Beam Gun Installed on a Time-of-Flight Mass Spectrometer

〇Satoshi Ninomiya¹, Yuji Sakai², Mauo Sogo³, Takuya Miyayama³, Daisuke Sakai³, Katsumi Watanabe³, LeeChuin Chen¹, Kenzo Hiraoka² (1.Univ. of Yamanashi, 2.Univ. Yamanashi CERC, 3.ULVAC-PHI)

Keywords:cluster ion beam,Electrospray,Secondary ion mass spectrometry

In previous studies, we have developed a technique for electrospraying aqueous solutions in vacuum, which allows improving the performance as a primary massive cluster ion beam source for secondary ion mass spectrometry. In this study, secondary ions emitted by the charged droplets produced in vacuum were measured for several organic samples with a time-of-flight secondary ion mass spectrometer.