Characterization of purity Mg<sub>2</sub>Si crystals grown by vertical Bridgman method

Presentation information

Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

Sun. Mar 20, 2016 4:00 PM - 6:00 PM P13 (Gymnasium)

4:00 PM - 6:00 PM

〇(B)Kohei Nakano¹, Tsubasa Otsubo¹, Shu Konno¹, Haruhiko Udono¹ (1.Ibaraki Univ.)

Keywords:Mg2Si