The 63rd JSAP Spring Meeting, 2016

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Symposium » State-of-the-art characterization technique of dielectric and ferroelectric materials

[20p-W641-1~9] State-of-the-art characterization technique of dielectric and ferroelectric materials

Sun. Mar 20, 2016 1:45 PM - 6:15 PM W641 (W6)

Wataru Sakamoto(Nagoya Univ.), Satoshi Wada(Univ. of Yamanashi)

3:15 PM - 3:45 PM

[20p-W641-4] Characterization of Dielectric and Ferroelectric Materials by X-ray Diffraction

〇Hitoshi Morioka1 (1.Bruker AXS)

Keywords:X-ray diffraction,dielectric materials,ferroelectric materials