Symposium

[20p-W641-1~9] State-of-the-art characterization technique of dielectric and ferroelectric materials

Sun. Mar 20, 2016 1:45 PM - 6:15 PM W641 (W6)

Wataru Sakamoto(Nagoya Univ.), Satoshi Wada(Univ. of Yamanashi)

1:45 PM - 2:15 PM

[20p-W641-1] Recent progress of highly reliable FRAM

〇Yukinobu Hikosaka¹ (1.FUJITSU SEMICONDUCTOR LIMITED)

2:15 PM - 2:45 PM

〇Naoya Shibata¹ (1.Univ. Tokyo)

2:45 PM - 3:15 PM

〇Hiroki Taniguchi¹ (1.Nagoya Univ.)

3:15 PM - 3:45 PM

〇Hitoshi Morioka¹ (1.Bruker AXS)

4:00 PM - 4:15 PM

〇Atsushi Inuzuka¹, Shusuke Takahashi¹, Kota Yoshida¹, Ryotaro Inoue², Yuji Noguchi¹, Masaru Miyayama¹ (1.Univ. of Tokyo, 2.Nihon Univ.)

4:15 PM - 4:45 PM

〇Iwazaki Yoshiki¹ (1.TAIYO YUDEN)

4:45 PM - 5:15 PM

〇Ishii Koji¹ (1.Oxford Instruments)

5:15 PM - 5:45 PM

〇Akira Ando¹ (1.Murata Mfg. Co.)

5:45 PM - 6:15 PM

〇Isaku Kanno¹, Yuichi Tsujiura¹, Fumiya Kurokawa¹, Hirotaka Hida¹ (1.Kobe Univ.)